Technical Leadership, Production Analytics Pipelines, Silicon Characterization, Data Automation, Debug Infrastructure, Yield Engineering, Statistical Modeling, Product Definition, Test Content Strategies

product assembly requirement specification, risk assessments, costing, Root Cause Analysis, New Product Development, substrate technology, Process Documentation, Feasibility Studies, technical support, substrate supplier selection, yield manufacturability, design rules, corrective actions

Test Methodology, HAST, Test failure analysis, Temperature correlation, Reliability assurance, Test parameter analysis, Sampling plan, Burn-in, Guardbands for QC, Continuous performance optimization, Limit setting, Data analysis software, Yield analysis, Reliability Testing, Yield improvement, Data Analysis, Product characterization

Project management and technical leadership, DPPM evaluation and improvements, Failure analysis and resolution