Electrical verification, Thermal HS Imaging, Fault isolation methodologies, OBIRCH, 2D 3D X-Ray, CAD and schematic interpretation, C-SAM, Parametric Analyzer, Bench Set Up for Functional Failures, Package level and die level delayering and cross-sectioning, EDX, Physical failure analysis, Root cause analysis methodologies

raman spectroscopy , Statistical Analysis, Test Database systems, Zygo, data visualization tools Spotfire, ESCA, FIB-SEM, failure mode analysis, FA database systems, data interpretation methods, defect characterization techniques, analytical tools such as SEM-EDX, TOF-SIMS, OSA

raman spectroscopy , Statistical Analysis, Test Database systems, Zygo, data visualization tools Spotfire, ESCA, FIB-SEM, failure mode analysis, FA database systems, data interpretation methods, defect characterization techniques, analytical tools such as SEM-EDX, TOF-SIMS, OSA