Big Data Analytics, Sql, OEE tracking, semiconductor test processes, analytical tools, Fmea, Control Plans, wafer sorting, Burn In test, data-driven problem-solving, yield management systems, IATF 16949 standards, wafer level testing, 8D problem-solving

Outlook, Excel, vacuum systems, Word, Troubleshooting process controls, Power Point, Data readback from machine control limits, MS Windows Software, Sputtering equipment

Spotfire, Minitab, Spc, Doe, Jmp, Problem Solving

Microsoft Office, MTBA, ASM DA AD838, Check list, Throughput, Mtbf, Machine OCAP, Die Attach machine, DMAC, 8D, Machine FMEA, PDCA

solution implementation , Debugging, Soc, electronic engineering, Teradyne Nextest Magnum 1 2 2X, Electronic circuitry knowledge, Electronics, Statistical evaluation, Electrical test failure analysis, Mixed-signal devices, Root Cause Determination, CMOS, Semiconductor devices operation, Ate, Product qualification, Advantest V93000, Statistical 8D Mythology, Quality Tools, System-level testing analysis