test program development , C, Test Methodology, VB, Test Engineering, Perl, Debugging, programming, Python, Tcl, yield analysis, Mixed signal circuits, statistical methodology, IC packaging, circuit physic stress method test methods, Yield improvement, device level test flow, temperature testing requirements, ATE manufacturing test flow, Root Cause Analysis, Fault Models, problem-solving techniques, Tk

Statistical Analysis, Tcl, Verilog, C, Python, Perl, on-chip interconnects, VHDL, EDA Tools, systemverilog, Embedded Systems, Ate

PERL, object-oriented programming

Testing Methodologies, UNIX, Windows, Shell, Linux, Python, Perl, lab instrumentation, NAND applications terminology, SD application testing, JEDEC standards, NAND architecture, NAND interface protocols, debugging hardware software systems, product qualification

manufacturing processes , power integrity , Ms Office, design risk assessments, Signal Integrity, Root Cause Analysis, Statistical Tools