Test Methodologies, Cost Reduction, Data Analysis, Problem Analysis, qualification reports, yield improvement, statistical quality tools, BOM maintenance, debug guides

project management, semiconductor digital device testing concepts, semiconductor device fabrication manufacturing processes, Product definition, wafer process, yield analysis, ATE SLT testing methodology

Optical knowledge, Jmp, DRBFM, Test Process methodology, Six Sigma Green or Black Belt, 7QC, Fmea, Minitab, Statistical Engineering, Structured Problem Solving Tools, SPST, Product Engineering, Product Characterization, Data Analysis