semiconductor process , integrated circuit , Jmp, Data manipulation and analysis, Products IC modules, Driver Power Stage, Exenso, Development NPI Product Engineering, Pdf, Product Test Knowledge

Java, Windows, Groovy, Linux, Perl, Ruby, Python, Data Analysis, ATE test platforms, Debug, Silicon Characterization, Advantest V93K, Advantest SMT8, DFT Design-For-Test architecture

Java, Windows, Groovy, Linux, Perl, Ruby, Python, Data Analysis, ATE test platforms, Debug, Silicon Characterization, Advantest V93K, Advantest SMT8, DFT Design-For-Test architecture

semiconductor ATE systems, Bench testing, ATE platforms, advanced data analytics, ASL1000 test development

solution implementation , Debugging, Soc, electronic engineering, Teradyne Nextest Magnum 1 2 2X, Electronic circuitry knowledge, Electronics, Statistical evaluation, Electrical test failure analysis, Mixed-signal devices, Root Cause Determination, CMOS, Semiconductor devices operation, Ate, Product qualification, Advantest V93000, Statistical 8D Mythology, Quality Tools, System-level testing analysis

Statistical Analysis, Validation methodologies, Data analysis by JMP, Doe, Transceiver OSA product structure