Test Methodology, UltraFlex test handler, yield analysis, Adventest 93K, quality management tools, debugging skills, wafer prober

Data Analytics, device characterization, x86 GPU High Speed IO operation, Circuit sensitivity analysis, Silicon Characterization, Fab process, Product Engineering, Product Management methodology, Yield improvement activities

Data Analytics, High Speed IO operation, x86 GPU, device characterization, Circuit sensitivity analysis, Silicon Characterization, Fab process, Yield improvement, Product management methodology

Data Analytics, device characterization, High Speed IO operation, x86 GPU, Circuit sensitivity analysis, Silicon Characterization, Product management methodology, Fab process, Yield improvement

Data Analytics, device characterization, High Speed IO operation, x86 GPU, Circuit sensitivity analysis, Silicon Characterization, Product management methodology, Fab process, Yield improvement

Test Methodology, Silicon Validation, manufacturing debug, Advantest 93K, Smart Scale, ATE test development, Teradyne UFLEX testers, Dft, silicon process fundamentals, DFM concepts, yield analysis

project management, Leadership, semiconductor water quality requirements, water treatment design software and tools