coverage analysis, CMT HMDT test module conversion, analog circuit fundamentals, silicon debug, DFT Design-for-Test, silicon bring-up, test vector generation, DFT definition development, memory test methodology, ATE program development

Java, Windows, Groovy, Linux, Perl, Ruby, Python, ATE Test patterns, Data Analysis, ATE test platforms, Debug, Silicon Characterization, test flows, DFT Design-For-Test architecture, Method Development

Java, Windows, Groovy, Linux, Perl, Ruby, Python, ATE Test patterns, Data Analysis, ATE test platforms, Debug, Silicon Characterization, test flows, DFT Design-For-Test architecture, Method Development

Java, Windows, Groovy, Linux, Perl, Ruby, Python, ATE Test patterns, Data Analysis, ATE test platforms, Debug, Silicon Characterization, test flows, DFT Design-For-Test architecture, Method Development

Data analysis tools, Yield optimization