Die Sort, Wafer level burn-in test systems, Custom DOE, Wafer test processes, Fmea, Scripting proficiency

Soc, FPGAs, IC Test, IC design, Standard IEEE fundamentals, test methodology for ASIC

C, Perl, Pcie, Linux, Automation Frameworks, Python, x86 server platforms, validation methodologies, PC architecture, microprocessor fundamentals, Windows server operating systems, Power Performance Thermal characterization, Test Development, datacenter GPU architecture, debugging skills, system test planning, test infrastructure, AMD Instinct™