Predictive Analytics, Test Engineering, defect density modelling, ATE platforms, yield learning, Design Verification, RTL, anomaly detection, system debug, semiconductor experience, Dft, ATE development, Product Development, EDA Tools, architecture, silicon bring-up, parametric analysis, yield engineering, characterization, OSAT test operations, AI solutions, adaptive test

Power Bi, Sql, Jtag, automation, Excel, Python, Scripting, guardband optimization, DFT features, yield analysis, MBIST, CREST, Jmp, data-driven decision making, Silicon Characterization, Scan, Statistical Modeling, Doe, correlation studies, semiconductor test methodologies, engineering data analysis tools