test programs, firmware diagnostics, test optimization, Automatic Test Equipment

test programs, failure analysis methodologies, Automatic Test Equipment, Manufacturing Execution Systems, test process optimization, design of experiments tools

Functional Testing, Testing Methodologies, Cross-sectioning, fib, TIVA, Voltage Contrast techniques, Backside preparation, OBIRCH, Fabrication technologies, Package preparation, device physics, SEI, Sem, Electrical failure verification, Dry chemical processes, Sample preparation for failure analysis, Defect imaging and characterization using Optical Microscopy, Fault localization using I-V characterization, Practical knowledge of semiconductor manufacturing processes