Promotion of Innovation, Basic device physics, Data Analysis, Statistics, DRAM architecture, Reliability Test Flow Development, Cross-Functional Collaboration, DPM reduction, Risk Management, Project Management, Reliability Test Plan and Execution, Root Cause and Resolution of Qual and RMA Device Issues, CMOS technology, Process Conversions and HVM, Mentorship and Development of Others, Technical Decision Making

transistors , Pds, Reliability, quality tools such as FMEA, LEDs, operating principles of diodes, 8D, DFQ, ASICs, Product Quality, semiconductor backend processes, DFX, module packaging, quality issue resolution, Validation, Product Engineering, Customer Management, Qualification, semiconductor device physics, module testing process, advanced product quality, VCSELs, Customer Quality Management, Failure Analysis, Reliability Failure Analysis

regulators , Verilog, Matlab, deep sub-micron CMOS technologies, TX, IC design CAD tools, RX, high-speed design techniques, Spectre, DACs, Spice, Filters, lab testing skills, ADCs, HSIM, Bandgap bias circuits, Pll

regulators , receivers , Dac, Python Scripting, mixer, Oscillators, Temp Sensors, Transmitters, Pa, RF General, bandgaps, submicron CMOS technologies, RF modules, Dfm, parasitic reduction, linear switched ADC, VCO, Amplifiers, LNA, Cadence Virtuoso VXL, Mentor Calibre, Analog Mixed Signal Design, Esd, Analog Layout, Pll

boundary scan , Perl, Linux Shell Scripting, Tcl, Python, SSN, chip level DFT rule checking, MBIST, DFT instruments, EDA Tools, make, Failure Analysis, TAP controller, EDT, in-house verification tools, LBIST, advanced DFT techniques, industrial simulation tools, occ

boundary scan , Perl, Linux Shell Scripting, Python, Tcl, DFT instruments, Synthesis, digital DFT design, MBIST, make, ASIC development, SSN, ATE test, occ, formal verification, EDA Tools, silicon failure analysis, EDT, TAP controller, logic simulation, LBIST