Statistical Analysis, mechanical tools, defect detection, failure modes analysis, failure analysis techniques, Ftir, fault isolation, Sem

CAD and schematic interpretation, Bench test development and validation, Failure Analysis, Electrical fault isolation techniques

Artificial Intelligence, fib, OBIRCH, Thermal emission, Bench test setup, FESEM, verification fault isolation equipment, silicon level failure analysis, nano-probing, die de processing

Device Structures, Packaging Architectures, Sem, Failure Mechanisms, fib

customer communication , failure reports, root cause investigation, 8D reports, Failure Analysis, RMA processes