rf engineering, signal source product, manufacturing transition

Linux Os, Synthesis, floorplanning, Cadence, LVS, Density, ECO implementation, Signal Integrity, SYN to GDS, clock tree, physical design verification, DRC, Antenna, Synopsys, EM IR analysis, formality verification

power integrity , Sockets, yield analysis, DUT boards, semiconductor test product engineering, ATE platforms, PS1600, test data mining, probe cards, load boards, test hardware design, Signal Integrity, statistical bin limit, final test processes, Advantest 93K, ExaScale, SmartScale

power delivery , Dll, Analog RTL Modeling, High-Speed Clock Distribution, DDR IO, Analog Mixed-Signal Circuit Design, Bandgap Reference, Spectre, ADE, High-Speed IO design, Analog Timing Analysis, LDO, Cadence Virtuoso, Clock Generation, Pll, SERDES

Statistical Analysis, Unix, Windows OS, Linux, High-speed digital design, BIOS OS and driver interactions, x86 CPU architecture, Logic analyzers, Jtag debuggers, PCIe bus analyzers, Signal Integrity

Unix, Windows OS, Os, DDR, BIOS, Pcie, Linux, Statistical Analysis, x86 CPU architecture, logic analyzers, driver interactions, Signal Integrity, Server system debug, Jtag debuggers, high-speed IO protocol, PCIe bus analyzers, high-speed digital design

Test Methodology, HAST, Test failure analysis, Temperature correlation, Reliability assurance, Test parameter analysis, Sampling plan, Burn-in, Guardbands for QC, Continuous performance optimization, Limit setting, Data analysis software, Yield analysis, Reliability Testing, Yield improvement, Data Analysis, Product characterization

Unix, Windows OS, Linux, Statistical Analysis, x86 CPU architecture, Jtag debuggers, PCIe bus analyzers, High-speed digital design, Logic analyzers, Signal Integrity

Test Methodology, Continuous performance optimization, Test failure analysis, Temperature correlation, Reliability assurance, Sampling plan, Test parameter analysis, Burn-in, Guardbands for QC, Debug techniques, Interpretation of test data, High volume testing, Limit setting, Failure Analysis, Yield analysis, Reliability Testing, Data Analysis, Yield improvement, Product characterization, HAST