Metrology Tools Type Expertise in Thin Film Critical Dimension and Resistivity, Metrology Process, Technology Transfer Experiences with Fab-Specific Metrology Tools Measurement Systems and Applications, Quality Knowledge, Training Tools and Certification Example JMP FMEA DOE and 8D, SPC Knowledge

Lift off, WET Process, Microsoft Applications, WET Resist Strip, Wafer cleaning processes, wafer process engineering, wafer fab manufacturing processes, Equipment Maintenance, Wet Etch, Single wafer lift off

cmo management , Quality Assurance, FDA-regulated environment, Project Management, Manufacturing processes methodologies, Product Engineering, process integration, Continuous Improvement, Process Control, Analytical Problem Solving, Failure Analysis, Test plans for components materials and systems, Biochemistry process, Wafer fabrication, Back-end packaging assembly, Yield engineering

Quality Assurance, process integration, Yield engineering, Product Engineering, Failure Analysis, Manufacturing processes methodologies, Engineering tools and software packages, Process Control, Continuous Improvement