Prototyping, signal analysis, rf engineering, manufacturing transition, reliability improvement

power integrity , Sockets, yield analysis, DUT boards, semiconductor test product engineering, ATE platforms, PS1600, test data mining, probe cards, load boards, test hardware design, Signal Integrity, statistical bin limit, final test processes, Advantest 93K, ExaScale, SmartScale

Test Documentation, reliability test execution, logic analyzers, Oscilloscopes, DPPM improvement, Multimeter, Failure Analysis