Technical Leadership, Silicon Characterization, Production Analytics Pipelines, Data Automation, Debug Infrastructure, Yield Engineering, Statistical Modeling, Product Definition, Test Content Strategies

test program development , C, Test Methodology, VB, Test Engineering, Perl, Debugging, programming, Python, Tcl, yield analysis, Mixed signal circuits, statistical methodology, IC packaging, circuit physic stress method test methods, Yield improvement, device level test flow, temperature testing requirements, ATE manufacturing test flow, Root Cause Analysis, Fault Models, problem-solving techniques, Tk