manufacturing processes , optical microscope , defect mechanisms, ZYGO, laboratory and analytical equipment, Root Cause Analysis, OSA

raman spectroscopy , Statistical Analysis, defect characterization techniques, Zygo, Test Database systems, failure mode analysis, FIB-SEM, ESCA, TOF-SIMS, OSA, analytical tools such as SEM-EDX, data interpretation methods, data visualization tools Spotfire, FA database systems

raman spectroscopy , Statistical Analysis, Test Database systems, Zygo, data visualization tools Spotfire, ESCA, FIB-SEM, FA database systems, data interpretation methods, TOF-SIMS, SEM-EDX, OSA