Statistical Analysis, Spc, DMAIC methodology, Lean Manufacturing, Doe, Msa, Lean Six Sigma

statistical process control (SPC), automation, Technical Writing, thin-film deposition techniques, Six Sigma methodologies, Microsoft Word, vacuum systems, Plc Programming, diagnostic tools and equipment for troubleshooting

wafer sputtering, wafer coating, wafer inspection, Minitab, Spc, Doe, wafer backgrind, CpK, wafer saw

test processes , automated test equipment, Root Cause Analysis, precision measurement systems, Doe, Lean Manufacturing, Pfmea, calibration processes, Six Sigma