Process Characterization, Recipe Tuning and Optimization, Sputter Parameters Monitoring, Process Compliance, vacuum technology, Troubleshooting, Sputter Process Improvement

statistical data analysis , Automated Test Equipment (ATE), Visual Basic, C, C++, handler, Advantest V93K, thermostream, Oscilloscope, prober, ATE measurement equipment

Test hardware debugging, Production test principles, Correlation characterization, Production release, Statistical analysis methodologies, Test program validation, Analog and digital circuits, Semiconductor device fundamentals

Statistical Process Control (SPC), Design of Experiments (DOE), Automated Defect Classification (ADC) systems, Manufacturing Execution Systems (MES), Automated Optical Inspection (AOI) systems, Pattern Recognition, Image Processing, AI Machine Learning applications, Root Cause Analysis, AOI recipe development, Machine vision technology, Defect classification techniques

Automated Test Equipment (ATE) platforms, teradyne j750 , Galaxy, 83K, HP660, 93K, NI PT, statistical data analysis tools, Advantest V93000, Jmp

Statistical Analysis, Data Analysis, AI proficiency, process characterization

statistical data analysis , test processes , Project Management Professional (PMP), NPI execution

Regression Analysis, Python Programming, statistical analysis tools, commonality analysis, semiconductor physics, thermal failure mechanisms, DMAIC problem-solving, Jmp