Outlook, Excel, sputter process, Troubleshooting, process characterization, Data Collection, process adjustments, MS Windows Software, process monitoring

Statistical Process Control (SPC), Design of Experiments (DOE), Automated Defect Classification (ADC) systems, Manufacturing Execution Systems (MES), Automated Optical Inspection (AOI) systems, Pattern Recognition, Image Processing, AI Machine Learning applications, Root Cause Analysis, AOI recipe development, Machine vision technology, Defect classification techniques

troubleshooting process and equipment issues, process control parameters, sputter process operations, process characterization, process adjustments, Data Collection, measurement techniques, process monitoring

statistical process control (SPC), laser ablation , AOI, Glue Dispense, EOL, Continuous Improvement, Control Plan, Electrical Test, Root Cause Analysis, Die Attach, AVI, Smt, Lean Manufacturing, Pfmea, Six Sigma, Wire Ribbon Bond

Statistical Process Control (SPC) platforms