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Electrical Engineer
  • Posted 8 hours ago
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Job Description

Job Description:

  • Path Delay Fault content and test-pattern generation, analysis, and debug, DFT/ATPG concepts, including scan and transition-delay fault coverage
  • Test-pattern generation, simulation, and failure analysis
  • Digital logic and semiconductor product development
  • Static timing analysis and timing-closure concepts
  • Familiarity with Verilog/SystemVerilog and scripting using Tcl, Python, or Perl
  • Lab, silicon, or product-level debug experience
  • Ability to analyze test data and communicate root-cause findings clearly

Key responsibilities

  • Generate path-delay-fault test content, including test patterns, pattern documentation, and related test-flow materials
  • Review and analyze ATPG output, simulation results, tester data, and failure signatures to improve generated content
  • Investigate path-delay and timing-related failures and help determine root cause
  • Correlate simulation, static timing, and silicon or product test results
  • Support test coverage improvement, pattern quality, and debug efficiency
  • Collaborate with DFT, design, validation, product engineering, and manufacturing teams
  • Document analysis, debug results, root cause, and corrective actions
  • Track issues to closure and provide clear technical status updates
  • Follow established engineering processes, quality requirements, and project schedules

Key Skills

Test-pattern generation simulation and failure analysis

Semiconductor product development

Static timing analysis and timing-closure concepts

Path Delay Fault content and test-pattern generation

DFT ATPG concepts including scan and transition-delay fault coverage

Lab silicon or product-level debug